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A comprehensive study of the impact of dislocation loops on leakage currents in Si shallow junction devices
by
C. Nyamhere
,
A. Scheinemann
,
A. Schenk
,
A. Scheit
,
F. Olivie
,
F. Cristiano
Published 2023
Subjects:
“…
Dislocation loops
…”
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research article
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A. Scheinemann
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A. Scheit
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A. Schenk
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C. Nyamhere
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CNRS , LAAS, 7 avenue du colonel Roche, F-31400 Toulouse, France; Univ de Toulouse , LAAS, F-31400 Toulouse, France; Midlands State University , P. Bag 9055, Gweru, Zimbabwe
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F. Cristiano
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F. Olivie
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