APA (7th ed.) Citation

Nyamhere, C., Scheinemann, A., Schenk, A., Scheit, A., Olivie, F., Cristiano, F., & CNRS , L. (2023). A comprehensive study of the impact of dislocation loops on leakage currents in Si shallow junction devices. American Institute of Physics.

Chicago Style (17th ed.) Citation

Nyamhere, C., A. Scheinemann, A. Schenk, A. Scheit, F. Olivie, F. Cristiano, and LAAS CNRS. A Comprehensive Study of the Impact of Dislocation Loops on Leakage Currents in Si Shallow Junction Devices. American Institute of Physics, 2023.

MLA (8th ed.) Citation

Nyamhere, C., et al. A Comprehensive Study of the Impact of Dislocation Loops on Leakage Currents in Si Shallow Junction Devices. American Institute of Physics, 2023.