Nyamhere, C., & University, M. S. (2022). Electrical and optical characterization of extended defects induced in p-type Si after Si ion implantation. Wiley.
Chicago Style (17th ed.) CitationNyamhere, Cloud, and Midlands State University. Electrical and Optical Characterization of Extended Defects Induced in P-type Si After Si Ion Implantation. Wiley, 2022.
MLA (8th ed.) CitationNyamhere, Cloud, and Midlands State University. Electrical and Optical Characterization of Extended Defects Induced in P-type Si After Si Ion Implantation. Wiley, 2022.
Warning: These citations may not always be 100% accurate.