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Thermal annealing behaviour of Pd Schottky contacts on melt-grown single crystal ZnO studied by IV and CV measurements

Thermal annealing behaviour of Pd Schottky contacts on melt-grown single crystal ZnO studied by IV and CV measurements

Current–voltage (IV) and capacitance–voltage (CV) measurement techniques have successfully been employed to study the effects of annealing highly rectifying Pd/ZnO Schottky contacts. IV results reveal a decrease in the contact quality with increasing annealing temperature as confirmed by a decreas...

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Bibliographic Details
Main Authors: Mtangi, W., Auret, F.D., Chawanda, Albert, Janse van Rensburg, P.J., Coelho, S.M.M., Nel, J.M., Diale, M., van Schalkwyk, L.
Format: Article
Language:English
Published: Elsevier 2016
Subjects:
Thermal annealing, Pd/ZnO Schottky, Depth profile
Surface conduction, Barrier height
Online Access:http://www.sciencedirect.com.access.msu.ac.zw:2048/science/article/pii/S0921510711004855
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