Effects of high temperature annealing on single crystal ZnO and ZnO devices

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Bibliographic Details
Main Authors: Mtangi, Wilfred, Auriet, F.D., Diale, M., Chawanda, Albert, Meyer, de H, Rensburg, P.J Janse, Nel, J. M.
Format: Article
Language:English
Published: American Institute of Physics 2014
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Online Access:http://hdl.handle.net/11408/418
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