Electrical and structural characterization of metal germanides

Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more chall...

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Bibliographic Details
Main Author: Chawanda, Albert
Format: Thesis
Language:English
Published: University of Pretoria 2016
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Online Access:http://hdl.handle.net/11408/1855
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