Electrical and structural characterization of metal germanides
Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more chall...
Saved in:
| Main Author: | |
|---|---|
| Format: | Thesis |
| Language: | English |
| Published: |
University of Pretoria
2016
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/11408/1855 |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| _version_ | 1779905202568036352 |
|---|---|
| author | Chawanda, Albert |
| author_facet | Chawanda, Albert |
| author_sort | Chawanda, Albert |
| collection | DSpace |
| description | Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more challenging, new material and device structures to relax this physical limitation in device scaling are now required. Germanium (Ge) has been proposed as a potential alternative to silicon. |
| format | Thesis |
| id | ir-11408-1855 |
| institution | My University |
| language | English |
| publishDate | 2016 |
| publisher | University of Pretoria |
| record_format | dspace |
| spelling | ir-11408-18552022-06-27T13:49:07Z Electrical and structural characterization of metal germanides Chawanda, Albert Electrical,structural characterization, metal germanides Metal-semiconductor contacts have been widely studied in the past 60 years. These structures are of importance in the microelectronics industry. As the scaling down of silicon-based complementary metal-oxide-semiconductor (CMOS) devices becomes more and more challenging, new material and device structures to relax this physical limitation in device scaling are now required. Germanium (Ge) has been proposed as a potential alternative to silicon. 2016-10-30T11:58:45Z 2016-10-30T11:58:45Z 2010 Thesis repository.up.ac.za/dspace/bitstream/handle/2263/28009/00front.pdf?sequence http://hdl.handle.net/11408/1855 en none University of Pretoria |
| spellingShingle | Electrical,structural characterization, metal germanides Chawanda, Albert Electrical and structural characterization of metal germanides |
| title | Electrical and structural characterization of metal germanides |
| title_full | Electrical and structural characterization of metal germanides |
| title_fullStr | Electrical and structural characterization of metal germanides |
| title_full_unstemmed | Electrical and structural characterization of metal germanides |
| title_short | Electrical and structural characterization of metal germanides |
| title_sort | electrical and structural characterization of metal germanides |
| topic | Electrical,structural characterization, metal germanides |
| url | http://hdl.handle.net/11408/1855 |
| work_keys_str_mv | AT chawandaalbert electricalandstructuralcharacterizationofmetalgermanides |